aNexus PS-HM-8425 Hall measurement package for the CRX-VF probe station

Upgrade your probe station effortlessly with comprehensive Hall measurement capabilities using the complete solution tailored for the CRX-VF probe station.

This solution supports a diverse range of DC Hall measurements on wafer-scale materials and structures across varying temperatures and fields. It comes fully equipped with all necessary instrumentation and software required for facilitating Hall measurements effectively.

Capable of handling DC fields up to 2 T and resistances ranging from 0.5 mΩ to 100 GΩ, this system ensures versatility and precision in measurements.

The intuitive software streamlines system operation, data acquisition, and analysis, ensuring a user-friendly experience. Additionally, it supports data exportation for conducting multi-carrier analysis, enabling comprehensive examination of measurement results.

Upgrade your probe station effortlessly with comprehensive Hall measurement capabilities using the complete solution tailored for the CRX-VF probe station.

This solution supports a diverse range of DC Hall measurements on wafer-scale materials and structures across varying temperatures and fields. It comes fully equipped with all necessary instrumentation and software required for facilitating Hall measurements effectively.

Capable of handling DC fields up to 2 T and resistances ranging from 0.5 mΩ to 100 GΩ, this system ensures versatility and precision in measurements.

The intuitive software streamlines system operation, data acquisition, and analysis, ensuring a user-friendly experience. Additionally, it supports data exportation for conducting multi-carrier analysis, enabling comprehensive examination of measurement results.

The power of the Hall measurement software

The software offers several notable features:

– Supports van der Pauw and Hall bar measurements, including samples with gated Hall bars, making it ideal for device-level material analysis.

– Easily create a variable temperature Hall measurement with just three mouse clicks, streamlining experimentation.

– Flexibility to start and end measurements at your convenience, along with the ability to set up time loops for repeated measurements as per your schedule.

– Seamlessly insert resistance measurements into Hall measurement sequences, enhancing measurement flexibility.

– Utilize quick commands such as “Go to Temperature,” “Go to Field,” “Go to GBV” (gate bias voltage), and “Wait” to allow the system to pause and stabilize before continuing, ensuring precise measurements.

– Conduct resistance measurements at the beginning of experiments, facilitating quick sample checks to determine usable current, among other applications.

– Supports data export for multi-carrier analysis, enabling in-depth examination of measurement data.