Checkpoint's InfraScan 300 TDE is the world's leading laser scanning tool for locating failures in IC devices. Our standard configuration incorporates dual lasers for performing test on your devices. The first laser is 1340 nm and is incorporated into our design to produce local heating without induce photo-generated carriers for techniques such as TIVA, OBIC and SEI. The second laser is 1064 nm and perfectly suited for the LIVA and LADA applications where photo-generated carriers produce the desired effects.